Skip to Content

Publications

Export 11 results:
Sort by: Author [ Title  (Asc)] Type Year
Filters: First Letter Of Title is E  [Clear All Filters]
A B C D [E] F G H I J K L M N O P Q R S T U V W X Y Z   [Show ALL]
E
Grigorieff, N, Cherns D, Yates MJ, Hockly M, Perrin SD, Aylett MR.  1993.  Electron microscopy of ultra-thin buried layers in InP and InGaAs. Philosophical Magazine a-Physics of Condensed Matter Structure Defects and Mechanical Properties. 68:121-136. Abstract  Download: Grigorieff_PhilMag1993.pdf (5.82 MB)