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Ewald sphere correction for single-particle electron microscopy

TitleEwald sphere correction for single-particle electron microscopy
Publication TypeJournal Article
Year of Publication2006
AuthorsWolf, M, DeRosier DJ, Grigorieff N
Refereed DesignationRefereed
JournalUltramicroscopy
Volume106
Pagination376-82
Date PublishedMar
ISBN Number0304-3991 (Print)
Accession Number16384646
KeywordsAlgorithms, Data Display, Fourier Analysis, Imaging, Three-Dimensional/*methods, Microscopy, Electron/*methods, Viruses/chemistry/ultrastructure
Abstract

Most algorithms for three-dimensional (3D) reconstruction from electron micrographs assume that images correspond to projections of the 3D structure. This approximation limits the attainable resolution of the reconstruction when the dimensions of the structure exceed the depth of field of the microscope. We have developed two methods to calculate a reconstruction that corrects for the depth of field. Either method applied to synthetic data representing a large virus yields a higher resolution reconstruction than a method lacking this correction.

URLhttp://www.ncbi.nlm.nih.gov/entrez/query.fcgi?cmd=Retrieve&db=PubMed&dopt=Citation&list_uids=16384646
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