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Grigorieff, N, Cherns D, Yates MJ, Hockly M, Perrin SD, Aylett MR.  1993.  Electron microscopy of ultra-thin buried layers in InP and InGaAs. Philosophical Magazine a-Physics of Condensed Matter Structure Defects and Mechanical Properties. 68:121-136. Abstract  Download: Grigorieff_PhilMag1993.pdf (5.82 MB)
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